Introduction To Mixed-Signal IC Test and Measurement
Sorozatcím: The Oxford Series in Electrical and Computer Engineering;
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A termék adatai:
- Kiadó Oxford University Press
- Megjelenés dátuma 2001. február 8.
- ISBN 9780195140163
- Kötéstípus Keménykötés
- Terjedelem704 oldal
- Méret 243x197x36 mm
- Súly 1398 g
- Nyelv angol
- Illusztrációk numerous halftones and line figures 0
Kategóriák
Rövid leírás:
This is a textbook for advanced undergraduate and graduate level students in electrical engineering. It can also be used as a reference manual for the beginning professional test engineer. The course for which this book is appropriate would be called Mixed Signal IC Test and Measurement, Mixed Signal IC Design, or IC (Integrated Circuit) Test and Measurement. The book assumes a solid background in analog and digital circuits as well as working knowledge of computers and computer
programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure to elementary probability and statistical
concepts.
Hosszú leírás:
Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the
subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement.
This book was written in response ot the shortage of basic course material for mixed-signa test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is desinged to be useful as both a university textbook and as a reference manual for the beginning professional test
engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts.
Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements.
Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15.
Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester.
ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing
methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same
tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes,
yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied,
including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component
selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std.
1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also,
statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to
attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement.
"Burns and Roberts have written an excellent book fulfilling the need for a good textbook on the subject of mixed-signal test measurement." Engineering Science & Education, 2002
Tartalomjegyzék:
Chapter 1: Overview of Mixed-Signal Testing
Mixed-Signal Ciruits
Why Test Mixed-Signal Devices
Post-Silicon Production Flow
Test and Diagnostic Equipment
New Product Development
Mixed-Signal Testing Challenges
Chapter 2: The Test Specification Process
Device Data Sheets
Generating the Test Plan
Components of a Test Program
Summary
Chapter 3: DC and Parametric Measurements
Continuity
Leakage Currents
Power Supply Currents
DC References and Regulators
Impedance Measurements
DC Offset Measurements
DC Gain Measurements
DC Power Supply Rejection Ratio
DC Common Mode Rejection Ratio
Comparator DC Tests
Voltage Search Techniques
DC Tests for Digital Circuits
Summary
Chapter 4: Measurement Accuracy
Terminology
Calibrations and Checkers
Dealing with Measurement Error
Basic Data Analysis
Summary
Chapter 5: Tester Hardware
Mixed-Signal Tester Overview
DC Resources
Digital Subsystem
AC Source and Measurement
Time Measurement System
Computing Hardware
Summary
Chapter 6: Sampling Theory
Analog Measurements Using DSP
Sampling and Reconstruction
Repetitive Sample Sets
Synchronization of Sampling Systems
Summary
Chapter 7: DSP-Based Testing
Advantages of DSP-Based Testing
Digital Signal Processing
Discrete-Time Transforms
The Inverse FFT
Summary
Chapter 8: Analog Channel Testing
Overview
Gain and Level Tests
Phase Tests
Distortion Tests
Signal Rejection Tests
Noise Tests
Simulation of Analog Channel Tests
Summary
Chapter 9: Sampled Channel Testing
Overview
Sampling Considerations
Encoding and Decoding
Sampled Channel Tests
Summary
Chapter 10: Focused Calibrations
Overview
DC Calibrations
AC Amplitude Calibrations
Other AC Calibrations
Error Cancellation Techniques
Summary
Chapter 11: DAC Testing
Basics of Converter Testing
Basic DC Tests
Transfer Curve Tests
Dynamic DAC Tests
DAC Architectures
Summary
Chapter 12: ADC Testing
ADC Testing Versus DAC Testing
ADC Code Edge Measurements
DC Tests and Transfer Curve Tests
Dynamic ADC Tests
ADC Architectures
Tests for Common ADC Applications
Summary
Chapter 13: DIB Design
DIB Basics
Printed Circuit Boards (PCBS)
DIB Traces, Shields, and Guards
Transmission Lines
Grounding and Power Distribution
DIB Components
Common DIB Circuits
Common DIB Mistakes
Summary
Chapter 14: Design for Test (DfT)
Overview
Advantages of DfT
Digital Scan
Digital BIST
Digital DfT for Mixed-Signal Circuits
Mixed-Signal Boundary Scan and BIST
Ad Hoc Mixed-Signal DfT
Subtle Forms of Analog DFT
IDDQ
Summary
Chapter 15: Data Analysis
Introduction to Data Analysis
Data Visualization Tools
Statistical Analysis
Statistical Process Control (SPC)
Summary
Chapter 16: Test Economics
Profitability Factors
Direct Testing Costs
Debugging Skills
Emerging Trends
Summary
