Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching by Kaupp, Gerd;

Application to Rough and Natural Surfaces

Series: NanoScience and Technology;

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Product details:

Edition number Softcover reprint of hardcover 1st ed. 2006
Publisher Springer Berlin Heidelberg
Date of Publication 12 February 2010
Number of Volumes 1 pieces, Previously published in hardcover

ISBN 9783642066634
Binding Paperback
See also 9783540284055
No. of pages292 pages
Size 235x155 mm
Weight 474 g
Language English
Illustrations XII, 292 p. Tables, black & white

Categories

Reference works, dictionaries Biology in general Biochemistry Physical chemistry Anatomy, embryology, histology Engineering in general Electrical engineering and telecommunications, precision engineering Mechanical Engineering Sciences Optics Quantum physics (quantum mechanics) Furniture industry Further readings in the field of technology Reference works, dictionaries (charity campaign) Biology in general (charity campaign) Biochemistry (charity campaign) Physical chemistry (charity campaign) Anatomy, embryology, histology (charity campaign) Engineering in general (charity campaign) Electrical engineering and telecommunications, precision engineering (charity campaign) Mechanical Engineering Sciences (charity campaign) Optics (charity campaign) Quantum physics (quantum mechanics) (charity campaign) Furniture industry (charity campaign) Further readings in the field of technology (charity campaign)

Long description:

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.