Atomic Force Microscopy in Process Engineering
An Introduction to AFM for Improved Processes and Products
- Publisher's listprice EUR 149.00
-
61 797 Ft (58 855 Ft + 5% VAT)
The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.
- Discount 20% (cc. 12 359 Ft off)
- Discounted price 49 438 Ft (47 084 Ft + 5% VAT)
Subcribe now and take benefit of a favourable price.
Subscribe
61 797 Ft
Availability
printed on demand
Why don't you give exact delivery time?
Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.
Product details:
- Publisher Elsevier Science
- Date of Publication 3 July 2009
- ISBN 9781856175173
- Binding Hardback
- No. of pages304 pages
- Size 228x152 mm
- Weight 600 g
- Language English 0
Categories
Long description:
This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.
The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.
MoreTable of Contents:
Basic Principles of Atomic Force Microscopy; Measurement of Particle and Surface Interactions Using Force Microscopy; Quantification of Particle-Bubble Interactions Using Atomic Force Microscopy; Investigating Membranes and Membrane Processes with Atomic Force Microscopy; AFM and Development of (Bio)Fouling Resistant Membranes; Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy; Micro/Nanoengineering and AFM for Cellular Sensing; Atomic Force Microscopy and Polymers on Surfaces; Application of AFM for the Study of Tensile and Microrheological Properties of Fluids; Future Prospects
More
Patents and Technological Progress in a Globalized World: Liber Amicorum Joseph Straus