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  • Atomic Force Microscopy in Process Engineering: An Introduction to AFM for Improved Processes and Products

    Atomic Force Microscopy in Process Engineering by Bowen, W. Richard; Hilal, Nidal;

    An Introduction to AFM for Improved Processes and Products

      • GET 20% OFF

      • The discount is only available for 'Alert of Favourite Topics' newsletter recipients.
      • Publisher's listprice EUR 149.00
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        61 797 Ft (58 855 Ft + 5% VAT)
      • Discount 20% (cc. 12 359 Ft off)
      • Discounted price 49 438 Ft (47 084 Ft + 5% VAT)

    61 797 Ft

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    Availability

    printed on demand

    Why don't you give exact delivery time?

    Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.

    Long description:

    This is the first book to bring together both the basic theory and proven process engineering practice of AFM. It is presented in a way that is accessible and valuable to practising engineers as well as to those who are improving their AFM skills and knowledge, and to researchers who are developing new products and solutions using AFM.

    The book takes a rigorous and practical approach that ensures it is directly applicable to process engineering problems. Fundamentals and techniques are concisely described, while specific benefits for process engineering are clearly defined and illustrated. Key content includes: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the development of fouling resistant membranes; nanoscale pharmaceutical analysis; nanoengineering for cellular sensing; polymers on surfaces; micro and nanoscale rheometry.

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    Table of Contents:

    Basic Principles of Atomic Force Microscopy; Measurement of Particle and Surface Interactions Using Force Microscopy; Quantification of Particle-Bubble Interactions Using Atomic Force Microscopy; Investigating Membranes and Membrane Processes with Atomic Force Microscopy; AFM and Development of (Bio)Fouling Resistant Membranes; Nanoscale Analysis of Pharmaceuticals by Scanning Probe Microscopy; Micro/Nanoengineering and AFM for Cellular Sensing; Atomic Force Microscopy and Polymers on Surfaces; Application of AFM for the Study of Tensile and Microrheological Properties of Fluids; Future Prospects

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