Thermal Reliability of Power Semiconductor Device in the Renewable Energy System
Series: CPSS Power Electronics Series;
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Product details:
- Edition number 1st ed. 2022
- Publisher Springer Nature Singapore
- Date of Publication 9 July 2023
- Number of Volumes 1 pieces, Book
- ISBN 9789811931345
- Binding Paperback
- See also 9789811931314
- No. of pages172 pages
- Size 235x155 mm
- Weight 356 g
- Language English
- Illustrations XVI, 172 p. 121 illus., 94 illus. in color. Illustrations, black & white 468
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Long description:
This book focuses on the thermal reliability of power semiconductor device by looking at the failure mechanism, thermal parameters monitoring, junction temperature estimation, lifetime evaluation, and thermal management. Theoretical analysis and experimental tests are presented to explain existing reliability improvement techniques. This book is a valuable reference for the students and researchers who pay attention to the thermal reliability design of power semiconductor device.
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