Microscopy of Semiconducting Materials
Proceedings of the 14th Conference, April 11-14, 2005, Oxford, UK
Series: Springer Proceedings in Physics; 107;
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Product details:
- Edition number 2005
- Publisher Springer Berlin Heidelberg
- Date of Publication 19 October 2010
- Number of Volumes 1 pieces, Previously published in hardcover
- ISBN 9783642068706
- Binding Paperback
- See also 9783540319146
- No. of pages540 pages
- Size 235x155 mm
- Weight 1442 g
- Language English
- Illustrations XVI, 540 p. 0
Categories
Long description:
This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.
MoreTable of Contents:
Epitaxy: Wide Band-Gap Nitrides.- Epitaxy: Silicon-Germanium Alloys.- Epitaxy: Growth and Defect Phenomena.- High Resolution Microscopy and Nanoanalysis.- Self-Organised and Quantum Domain Structures.- Processed Silicon and Other Device Materials.- Device Studies.- Scanning Electron and Scanning Probe Advances.
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