Applied Optical Metrology II
Series: Proceedings of SPIE;
- Publisher's listprice EUR 85.00
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35 253 Ft (33 575 Ft + 5% VAT)
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- Discount 8% (cc. 2 820 Ft off)
- Discounted price 32 433 Ft (30 889 Ft + 5% VAT)
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35 253 Ft
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Product details:
- Publisher SPIE
- Date of Publication 30 January 2018
- Number of Volumes Paperback
- ISBN 9781510612037
- Binding Paperback
- No. of pages292 pages
- Size 279x216 mm
- Language English 0
Categories
Short description:
Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.
MoreLong description:
Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.
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Applied Optical Metrology II
35 253 HUF
32 433 HUF
