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  • Applied Advanced Optical Metrology Solutions

    Applied Advanced Optical Metrology Solutions by Novak, Erik; Trolinger, James;

    Series: Proceedings of SPIE;

      • GET 8% OFF

      • The discount is only available for 'Alert of Favourite Topics' newsletter recipients.
      • Publisher's listprice EUR 79.00
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        32 765 Ft (31 205 Ft + 5% VAT)
      • Discount 8% (cc. 2 621 Ft off)
      • Discounted price 30 144 Ft (28 709 Ft + 5% VAT)

    32 765 Ft

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    Product details:

    • Publisher SPIE
    • Date of Publication 30 October 2015
    • Number of Volumes Paperback

    • ISBN 9781628417425
    • Binding Paperback
    • No. of pages277 pages
    • Size 279x216 mm
    • Language English
    • 0

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    Short description:

    Proceedings of SPIE offer access to the latest innovations in research and technology and are among the most cited references in patent literature.

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    Long description:

    Proceedings of SPIE present the original research papers presented at SPIE conferences and other high-quality conferences in the broad-ranging fields of optics and photonics. These books provide prompt access to the latest innovations in research and technology in their respective fields. Proceedings of SPIE are among the most cited references in patent literature.

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