Advances in X-Ray Analysis
Volume 35B
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Product details:
- Edition number Softcover reprint of the original 1st ed. 1992
- Publisher Springer US
- Date of Publication 21 November 2012
- Number of Volumes 1 pieces, Book
- ISBN 9781461365327
- Binding Paperback
- No. of pages641 pages
- Size 244x170 mm
- Weight 1100 g
- Language English
- Illustrations IV, 641 p. 0
Categories
Table of Contents:
Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.
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