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  • Advances in X-Ray Analysis: Volume 35B

    Advances in X-Ray Analysis by Barrett, C.S.; Gilfrich, John V.; Huang, Ting C.;

    Volume 35B

      • GET 8% OFF

      • The discount is only available for 'Alert of Favourite Topics' newsletter recipients.
      • Publisher's listprice EUR 87.95
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        36 477 Ft (34 740 Ft + 5% VAT)
      • Discount 8% (cc. 2 918 Ft off)
      • Discounted price 33 559 Ft (31 961 Ft + 5% VAT)

    36 477 Ft

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    Product details:

    • Publisher Springer
    • Date of Publication 31 October 1992
    • Number of Volumes Book

    • ISBN 9780306442490
    • Binding Hardback
    • No. of pages1334 pages
    • Weight 2760 g
    • Language English
    • Illustrations 65 Illustrations, black & white
    • 0

    Categories

    Table of Contents:

    Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD Instrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

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