Advances in X-Ray Analysis
Volume 33
- Publisher's listprice EUR 85.55
-
35 481 Ft (33 792 Ft + 5% VAT)
The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.
- Discount 12% (cc. 4 258 Ft off)
- Discounted price 31 224 Ft (29 737 Ft + 5% VAT)
Subcribe now and take benefit of a favourable price.
Subscribe
35 481 Ft
Availability
Temporarily out of stock.
Why don't you give exact delivery time?
Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.
Product details:
- Edition number 1990
- Publisher Springer US
- Date of Publication 1 June 1990
- Number of Volumes 1 pieces, Book
- ISBN 9780306436154
- Binding Hardback
- See also 9781461399988
- No. of pages704 pages
- Size 0x0 mm
- Weight 1430 g
- Language English
- Illustrations XX, 704 p. 0
Categories
Long description:
The 38th Annual Denver Conference on Applications of X-Ray Analysis was held July 31 - August 4, 1989, at the Sheraton Denver Technical Center, Denver, Colorado. The conference alternates emphasis between x-ray diffraction and x-ray fluorescence, and this being an odd year the emphasis was on diffraction. Thus the Plenary Session was slanted toward diffraction in general and thin film analysis in particular. The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. The session generated a great deal of interest, so Paul suggested that a workshop on thin films should be slated for the 1987 conference. A full day was devoted to the workshop, which was split into a half day on epitaxial thin films and the other half day on polycrystalline thin films. The workshop attendance indicated a great deal of interest in this topic, leading to this year's Plenary Session. The first two speakers of the Plenary Session (B. Tanner and K. Bowen) have been key throughout the thin film activities. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.
MoreTable of Contents:
I. Characterization of Epitaxial Thin Films and Crystal Defects by X-Ray Diffraction.- II. XRD Characterization of Polycrystalline Thin Films.- III. X-Ray Spectrometric Characterization of Thin Films.- IV. Analysis of Digital Diffraction Data Including Rietveld.- V. X-Ray Stress Analysis.- VI. Determination of Crystallite Size and Strain.- VII. Phase Identification, Structural and Quantitative Analysis by Diffraction.- VIII. X-Ray Spectrometry Data Analysis.- IX. XRF Instrumentation.- X. XRF Techniques for Hazardous Wastes and Other Applications.- Author Index.
More
Handmade Home: Living with Art and Craft
9 550 HUF
8 117 HUF
