Digital Integrated Circuit Design by Martin, Ken;

Sorozatcím: The Oxford Series in Electrical and Computer Engineering;

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A termék adatai:

Kiadás sorszáma New ed
Kiadó OUP USA
Megjelenés dátuma 1999. október 28.

ISBN 9780195125849
Kötéstípus Keménykötés
Terjedelem560 oldal
Méret 191x236x33 mm
Súly 1143 g
Nyelv angol
Illusztrációk numerous black and white figures

Kategóriák

Villamosmérnöki tudományok, híradástechnika, műszeripar Gépészmérnöki tudományok Energetika, energiaipar

Hosszú leírás:

Working from the fundamentals of transistor-level design and building up to system-level considerations, Digital Integrated Circuit Design shows students with minimal background in electronics how to design state-of-the-art high performance digital integrated circuits. Ideal as an upper-level undergraduate text, it can also be used in first-year graduate courses and as a reference for practicing engineers.

Digital Integrated Circuit Design:
* Presents transistor-level details first, building up to system considerations
* Emphasizes CMOS technology but also includes in-depth explanations of designing in bipolar, BiCMOS, and GaAs technologies
* Features modern, well-designed examples and problems
* Covers important system-level considerations such as timing, pipelining, clock distribution, and system building blocks in detail
* Discusses key elements of semiconductor physics, integrated circuit processing, transistor-level design, logic-level design, system-level design, testing, and more
* Provides physical and intuitive explanations throughout
* Emphasizes conceptual thinking and design methodology over detailed circuit analysis techniques

Több

Tartalomjegyzék:

Preface
1. THE BASICS
Simple NMOS Logic Gates
Simple CMOS Logic Gates
Computer Simulation
Transfer Curves and Noise Margins
Gate Delays and Rise and Fall Times
Transient Response
An RC Approximation to the Transient Response of a CMOS Inverter
Summary
Bibliography
Problems
2. PROCESSING, LAYOUT, AND RELATED ISSUES
CMOS Processing
Bipolar Processing
CMOS Layout and Design Rules
Advanced CMOS Processing
Bibliography
Problems
3. INTEGRATED-CIRCUIT DEVICES AND MODELING
Simplified Transistor Modeling
Semiconductors and pn Junctions
MOS Transistors
Advanced MOS Modeling
Bipolar-Junction Transistors
SPICE-Modeling Parameters
Appendix
SPICE Simulations
4. TRADITIONAL MOS DESIGN
Pseudo-NMOS Logic
Pseudo-NMOS Logic Gates
Transistor Equivalency
CMOS Logic
CMOS Gate Design
SPICE Simulations
Bibliography
Problems
5. TRANSMISSION-GATE AND FULLY DIFFERENTIAL CMOS LOGIC
Transmission-Gate Logic Design
Differential CMOS Circuits
Bibliography
Problems
6. CMOS TIMING AND I/O CONSIDERATIONS
Delay of MOS Circuits
Input/Output Circuits
Bibliography
Problems
7. LATCHES, FLIP-FLOPS, AND SYNCHRONOUS SYSTEM DESIGN
CMOS Clocked Latches
Flip-flops
CMOS Flip-flops
Synchronous System Design Techniques
Synchronous System Examples
Bibliography
Problems
8. BIPOLAR AND BiCMOS LOGIC GATES
Emitted-Coupled Logic Gates
Current-Mode Logic
BiCMOS
SPICE Simulations
Bibliography
Problems
9. ADVANCED CMOS LOGIC DESIGN
Pseudo-NMOS and Dynamic Precharging
Domino-CMOS Logic
No-Race-Logic
Single-Phase Dynamic Logic
Differential CMOS
Dynamic Differential Logic
Bibliography
Problems
10. DIGITAL INTEGRATED SYSTEM BUILDING BLOCKS
Multiplexors and Decoders
Barrel Shifters
Counters
Digital Adders
Digital Multipliers
Programmable Logic Arrays
Bibliography
Problems
11. INTEGRATED MEMORIES
Static Random-Access Memories
Static Random-Access Memory Storage Cells
Address Buffers and Decoders
Dynamic Bus Precharge and Address-Transition-Detect Circuits
Modifications for Large Static Random-Access Memories
Dynamic Random-Access Memories
Read-Only Memories
Bibliography
Problems
12. GaAs DIGITAL CIRCUITS
Introduction
GaAs Processing and Components
MESFET Modeling
MESFET Second-Order Effects
Logic Design with MESFETs
Capacitively Enhanced Logic
GaAs Logic Family Comparison
Heterojunction Bipolar Technology
Bibliography
Problems
13. DIGITAL SYSTEM TESTING
Conservative Design Principles
Scan-Design Techniques
Localized Test-Vector Generation and Test-Output Compression Techniques
Boundary-Scan Testing
Bibliography
Problems