Defect and Microstructure Analysis by Diffraction
Sorozatcím: International Union of Crystallography Monographs on Crystallography; 10;
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A termék adatai:
- Kiadó OUP Oxford
- Megjelenés dátuma 2000. január 6.
- Kötetek száma laminated boards
- ISBN 9780198501893
- Kötéstípus Keménykötés
- Terjedelem808 oldal
- Méret 241x162x48 mm
- Súly 1486 g
- Nyelv angol
- Illusztrációk numerous line figures 0
Kategóriák
Rövid leírás:
This book reviews the state of the art for determining the "real" structure of matter. Nature does not stack atoms up in crystals in a perfect manner. Various types of "mistakes" find their way into the arrangements of atoms in real crystals. These mistakes or defects determine the physical properties of a material and understanding them is critical to predicting a new materials properties. This book reviews the principal characterisation technique permitting us to measure the defect solid state: X-ray diffraction.
TöbbHosszú leírás:
Defect and Microstructure Analysis by Diffraction is focused on extracting information on the real structure of materials from their diffraction patterns. The primary features of a powder diffraction pattern are determined by the "idealized" periodic nature of the crystal structure. With the advent of computer automation the techniques for carrying out qualitative, quantitative and structure analysis based on the primary pattern features rapidly matured. In general, the deviations of a particular specimen, from the ideal or perfect crystal structure, cause diffraction peak profiles to broaden and sometimes to become asymmetric. Thus, information on the real structure or microstructure of a specimen can be obtained from a careful study of the diffraction line profiles. The evolving techniques for microstructure analysis from diffraction patterns such as micro-strain, crystallite size, macro-strain and preferred orientation analysis require an ever more detailed understanding of the effects of crystallographic mistakes on peak assymmetry and the effect of the distribution of small crystallites on the tails of diffraction peaks. This book provides a comprehensive analysis of the fundamental theory and techniques for microstructure analysis from diffraction patterns and summarizes the current state of the art. This complete survey lays the foundation for the next and last major development in this field: the extraction of the full information in a powder pattern by the simulation of the full experimental pattern. The goal of this branch of science is to extract all of the information locked in the powder diffraction pattern including: the types and densities of stacking faults, the strain field produced by each, the anisotropic crystallite size and orientation, along with the size and strain distributions of each phase in a specimen. This book provides a complete summary of the developments of the twentieth century and points the way.
'This book reviews the state of the art for determining the "real" structure of matter' Zeitschrift Fur kristallographie
Tartalomjegyzék:
Introduction to Defect and Microstructure Analysis or the Analysis of Real-Structure
Some Applications of the Kinematical Theory of X-ray Diffraction
Profile Fitting and Analytical Functions
Effects of Instrument Function, Crystallite Size, and Strain on Reflection Profiles
Use of Pattern Decomposition or Simulation to Study Microstructure: theoretical considerations
Classical Treatment of Line Profiles Influenced by Strain, Small Size, and Stacking Faults
Voigt-Function Model in Diffraction Line-Broadening Analysis
X-Ray Analysis of Precipitation Related Crystals with Dislocation Substructure
The Dislocation Based Model of Strain Broadening in X-Ray Line-Profile Analysis
Diffraction-Line Broadening Analysis of Dislocation Configurations
Diffraction-Line Broadening Analysis of Strain Fields in Crystalline Solids
Paracrystallinity
The Model of the Paracrystal and its Application to Polymers
Effect of Planar Defects in Crystal on the Position and Profile of Powder Diffraction Line
Effect of Stacking Disorder on the Profile of the Powder Diffraction Line
Crystallite Statistics and Accuracy in Powder Diffraction Intensity Measurements
Reciprocal Space Mapping and Ultra-High Resolution Diffraction of Polycrystalline Materials
X-Ray Analysis of The Inhomogeneous Stress State
Texture Analysis
Texture Effects in Powder Diffraction and their Correction by Simple Empirical Functions
Accounting For Size and Microstrain in Whole Powder Pattern Fitting
Modelling of Texture in Whole Pattern Fitting
A New Whole Powder Pattern Fitting Approach
The Role of Whole-Pattern Databases in Materials Science
Restoration and Preprocessing of Physical Profiles from Measured Data
Towards Higher Resolution: A Mathematical Approach
Use of Pattern Decomposition to Study Microstructure: Practical Aspects and Applications
X-Ray Diffraction Broadening Effects in Materials Characterization
Crystal Size and Distortion Parameters in Fibres using WAXS
Pressure Induced Profile Change of Energy Dispersive Diffraction
