Transmission Electron Microscopy
The Companion Volume
-
GET 12% OFF
- Publisher's listprice EUR 117.69
-
48 811 Ft (46 487 Ft + 5% VAT)
The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.
- Discount 12% (cc. 5 857 Ft off)
- Discounted price 42 954 Ft (40 909 Ft + 5% VAT)
42 954 Ft
Availability
Not yet published.
Why don't you give exact delivery time?
Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.
Product details:
- Edition number 2
- Publisher Springer Nature Switzerland
- Date of Publication 21 June 2026
- Number of Volumes 1 pieces, Book
- ISBN 9783031807886
- Binding Hardback
- No. of pages809 pages
- Size 279x210 mm
- Language English
- Illustrations XXXIII, 809 p. 515 illus., 330 illus. in color. Illustrations, black & white 700
Categories
Long description:
This volume is the second edition of Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry building upon the foundation of the first edition while significantly expanding and updating its scope. The book remains true to its mission of being a student-focused textbook, designed to complement the bestselling Transmission Electron Microscopy: A Textbook for Materials Science, by Williams and Carter.
As a comprehensive guide to advanced topics in TEM (Transmission Electron Microscopy), this companion covers the latest technological advancements, new applications, and enduring techniques essential to the field. The chapters explore rapidly evolving areas like in-situ experiments, electron diffraction, STEM, energy-filtered TEM (EFTEM) imaging, holography, and tomography. It also emphasizes both theoretical and practical aspects of TEM, with expert insights from world-renowned researchers.
Since the first edition of this book, the field of TEM has advanced significantly, particularly in the realms of computer-controlled instrumentation and data acquisition. This edition reflects the maturation of techniques like cryogenic electron microscopy, holography, and ptychography, all of which are now more accessible due to software-driven innovations.
As in the first edition, this volume includes two sets of questions at the end of each chapter: one for self-assessment and another suitable for homework assignments. The text encourages a thoughtful, interactive learning process, prompting students to engage deeply with the material and further explore scientific literature and resources.
Richly illustrated with high-quality color figures, this new edition offers unparalleled visual representations of the complex phenomena under study. It provides clarity on key challenges and pitfalls in modern TEM techniques, making it an essential resource for both novice and experienced microscopists.
In keeping with its role as a textbook, this companion remains an important resource for graduate students and professionals in materials science, offering detailed discussion and practical guidance on a wide array of TEM technologies and methodologies.
MoreTable of Contents:
Electron Sources.- FIB of TEM Specimens.- In-Situ and Operando Experiments.- Applying a Stimulus to the Specimen.- In-Situ Irradiation.- Cryogenic Electron Microscopy.- Electron Diffraction and Phase Identification.- CBED: Symmetry and Large-Angle Patterns.- Electron Crystallography, Charge-Density Mapping and Nanodiffraction.- DigitalMicrograph.- Electron Waves, Interference & Coherence.- Electron Holography.- Focal-Series Reconstruction (FSR).- Single Atom Counting in HREM.- Quantitative STEM.- Imaging in the STEM.- 4D STEM.- Nanoparticle Characterization.- Electron Tomography (ET).- EFTEM.- Calculating EELS.- Diffraction AND X-ray Excitation.- X-ray and EELS Imaging.- Practical Aspects and Advanced Applications of XEDS.
More
