Properties of Crystalline Materials by X-ray Diffraction Methods and Symmetry Groups
A Practical Approach
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Product details:
- Edition number 1
- Publisher CRC Press
- Date of Publication 1 October 2025
- ISBN 9781032382371
- Binding Hardback
- No. of pages314 pages
- Size 234x156 mm
- Weight 453 g
- Language English
- Illustrations 139 Illustrations, black & white; 68 Halftones, black & white; 71 Line drawings, black & white; 30 Tables, black & white 700
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Short description:
This book provides a structure and properties of crystalline materials from a rigorous and systematic approach. From physical principles of X-rays to structural refinement using the Rietveld method, it provides a solid theoretical and practical foundation. This book is a reference for materials characterization.
MoreLong description:
This book is a fundamental work for those seeking to understand the structure and properties of crystalline materials from a rigorous and systematic approach. Its coverage, which ranges from the physical principles of X-rays to structural refinement using the Rietveld method, provides a solid theoretical and practical foundation. The inclusion of symmetry group analysis and the study of elasticity reinforce its value in areas such as electronics and engineering. With an educational and precise approach, this work becomes an indispensable reference for materials characterization.
MoreTable of Contents:
Introduction. Physical foundations of X-rays. Symmetry groups – Crystallography. Introduction to Tensor analysis. Introduction to Elasticity theory. Fundamentals of Rietveld Refinement. X-ray diffraction applications. A practical exercise using PANalytical X’Pert HighScore. Material properties from the symmetry group.
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