Advances in Imaging and Electron Physics
Optics of Charged Particle Analyzers
Series: Advances in Imaging and Electron Physics; 163;
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82 950 Ft (79 000 Ft + 5% VAT)
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Product details:
- Publisher Elsevier Science
- Date of Publication 14 September 2010
- ISBN 9780123813145
- Binding Hardback
- No. of pages248 pages
- Size 228x152 mm
- Weight 460 g
- Language English 0
Categories
Long description:
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
MoreTable of Contents:
"
- Identification Of Historical Pigments In Wall Layers By Combination Of Optical And Scanning Electron Microscopy Coupled To Energy Dispersive Spectroscopy - A. Sever Skapin
- Optical interference near surfaces and its application in sub-wavelength microscopy - W. S. Bacsa
- Introduction of a Quantum of Time (\chronon""), and its Consequences for the Electron in Quantum and Classical Physicsy - Ruy H. A Farias and Erasmo RECAMI
- Superresolution Imaging - Revisited - Markus E. Testorf
- Methods and Limitations of Subwavelength Imaging Andrew Neice
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