Rad-hard Analog ICs
Series: River Publishers Series in Electronic Materials, Circuits and Devices;
-
GET 10% OFF
- Publisher's listprice GBP 115.00
-
51 922 Ft (49 450 Ft + 5% VAT)
The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.
- Discount 10% (cc. 5 192 Ft off)
- Discounted price 46 730 Ft (44 505 Ft + 5% VAT)
46 730 Ft
Availability
Not yet published.
Why don't you give exact delivery time?
Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.
Product details:
- Edition number 1
- Publisher River Publishers
- Date of Publication 1 September 2026
- Number of Volumes Hardback
- ISBN 9788770224192
- Binding Hardback
- No. of pages256 pages
- Size 234x156 mm
- Weight 453 g
- Language English
- Illustrations 438 Illustrations, black & white 700
Categories
Short description:
This is a practical guide to designing and characterizing radiation-hardened analog and mixed-signal circuits in standard CMOS. Covering BGRs, DACs, ADCs, RHBD techniques, and radiation testing under TID and SEE, it walks readers from device-level mitigation to layout strategies and measured experimental results.
MoreLong description:
Rad-hard Analog ICs is a practical guide for researchers and engineers designing and preliminarily characterizing radiation-hardened analog and mixed-signal circuits in standard CMOS technologies across multiple foundries and nodes.
The opening chapter explains the fundamental radiation effects encountered in space and other harsh environments, establishing the scientific basis for radiation hardening by design (RHBD) techniques used to mitigate total ionizing dose (TID), single-event effects (SEE), and transient disturbances.
The core chapters focus on three essential building blocks—band-gap references (BGRs), digital-to-analog converters (DACs), and analog-to-digital converters (ADCs). Each chapter begins with a concise review of circuit operating principles, followed by a survey of leading RHBD strategies from the literature. The authors then present their own rad-hard implementations, detailing the complete design flow from transistor-level mitigation techniques to layout-level hardening strategies.
The final chapter provides a practical overview of radiation testing methodologies for analog and mixed-signal circuits, with emphasis on experimental campaigns conducted by the authors. Measured results under TID and SEE conditions illustrate both characterization techniques and real-world performance.
Topics include:
- Radiation effects and RHBD methodologies
- Rad-hard band-gap references (BGRs)
- Rad-hard digital-to-analog converters (DACs)
- Rad-hard analog-to-digital converters (ADCs)
- Radiation testing of analog and mixed-signal ICs
Table of Contents:
1. Radiation Effects and RHBD Techniques 2. Rad-hard Voltage References 3. Rad-hard Digital-to-Analog Converters (DAC) 4. Rad-hard Analog-to-Digital Converter (ADC) 5. Testing of Rad-hard Analog Devices Under Radiations
More
