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21 546 Ft
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Product details:
- Publisher Elsevier Science
- Date of Publication 31 March 1989
- ISBN 9780120676361
- Binding Hardback
- No. of pages337 pages
- Size 229x152 mm
- Weight 630 g
- Language English 0
Categories
Long description:
Plasmas and their interaction with materials have become subjects of major interest because of their importance in modern forefront technologies such as microelectronics, fusion energy, and space. Plasmas are used in microelectronics to process semiconductors (etching of patterns for microcircuits, plasma-induced deposition of thin films, etc.); plasmas produce deleterious erosion effects on surfaces of materials used for fusion devices and spaceships exposed to the low earth environment.Diagnostics of plasmas and materials exposed to them are fundamental to the understanding of the physical and chemical phenomena involved. Plasma Diagnostics provides a comprehensive treatment of the subject.short version, TJE_Plasmas and their interaction with materials have become subjects of major interest because of their importance in modern forefront technologies such as microelectronics, fusion energy, and space. Diagnostics of plasmas and materials exposed to them are fundamental to the understanding of the physical and chemical phenomena involved. Plasma Diagnostics provides a comprehensive treatment of the subject.
MoreTable of Contents:
OF VOLUME 2: J.W. Coburn, Quartz Crystal Microbalances for Studies of Plasma-Surface Interactions. D.L. Smith, H.P. Gillis, and T.M. Mayer, Elemental Analysis of Treated Surfaces. D.E. Aspnes and R.P.H. Chang, Spectroscopic Ellipsometry in Plasma Processing. B.L. Doyle and W.-K. Chu, Ion Beam Analysis of Plasma-Exposed Surfaces. P.C. Stangeby, The Interpretation of Plasma Probes for Fusion Experiments. B.K. Bein and J. Pelzl, Analysis of Surfaces Exposed to Plasmas by Non-Destructive Photoacoustic and Photothermal Techniques.
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