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  • Materials Characterization Using Nondestructive Evaluation (NDE) Methods

    Materials Characterization Using Nondestructive Evaluation (NDE) Methods by Huebschen, Gerhard; Altpeter, Iris; Tschuncky, Ralf; Herrmann, Hans-Georg;

    Series: Woodhead Publishing Series in Electronic and Optical Materials;

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      • Publisher's listprice EUR 165.00
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        68 433 Ft (65 175 Ft + 5% VAT)
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      • Discounted price 61 590 Ft (58 658 Ft + 5% VAT)

    68 433 Ft

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    Product details:

    • Publisher Elsevier Science
    • Date of Publication 6 April 2016

    • ISBN 9780081000403
    • Binding Hardback
    • No. of pages320 pages
    • Size 228x152 mm
    • Weight 720 g
    • Language English
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    Long description:

    Materials Characterization Using Nondestructive Evaluation (NDE) Methods discusses NDT methods and how they are highly desirable for both long-term monitoring and short-term assessment of materials, providing crucial early warning that the fatigue life of a material has elapsed, thus helping to prevent service failures.

    Materials Characterization Using Nondestructive Evaluation (NDE) Methods gives an overview of established and new NDT techniques for the characterization of materials, with a focus on materials used in the automotive, aerospace, power plants, and infrastructure construction industries.

    Each chapter focuses on a different NDT technique and indicates the potential of the method by selected examples of applications. Methods covered include scanning and transmission electron microscopy, X-ray microtomography and diffraction, ultrasonic, electromagnetic, microwave, and hybrid techniques. The authors review both the determination of microstructure properties, including phase content and grain size, and the determination of mechanical properties, such as hardness, toughness, yield strength, texture, and residual stress.

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    Table of Contents:

    1. Atomic force microscopy (AFM) for materials characterization
    2. Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) for materials characterization
    3. X-ray micro-tomography for materials characterization
    4. X-ray diffraction (XRD) techniques for materials characterization
    5. Microwave, millimeter wave and terahertz techniques for materials characterization
    6. Acoustical microscopy for materials characterization
    7. Ultrasonic techniques for materials characterization
    8. Electromagnetic techniques for materials characterization
    9. Hybrid methods for materials characterization

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