High Energy Electron Diffraction and Microscopy
Series: Monographs on the Physics and Chemistry of Materials; 61;
- Publisher's listprice GBP 167.50
-
80 023 Ft (76 212 Ft + 5% VAT)
The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.
- Discount 10% (cc. 8 002 Ft off)
- Discounted price 72 020 Ft (68 591 Ft + 5% VAT)
Subcribe now and take benefit of a favourable price.
Subscribe
80 023 Ft
Availability
printed on demand
Why don't you give exact delivery time?
Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.
Product details:
- Publisher OUP Oxford
- Date of Publication 8 January 2004
- ISBN 9780198500742
- Binding Hardback
- No. of pages558 pages
- Size 241x161x33 mm
- Weight 1095 g
- Language English
- Illustrations numerous halftones & figures 0
Categories
Short description:
This book is an in-depth treatment of the theoretical background relevant to an understanding of materials that can be obtained by using high-energy electron diffraction and microscopy.
MoreLong description:
This book provides the reader with a comprehensive introduction to high energy electron diffraction and elastic and inelastic scattering of high energy electrons, with particular emphasis on applications to modern electron microscopy. Starting from a survey of fundamental phenomena, the authors introduce the most important concepts underlying modern understanding of high energy electron diffraction. Dynamical diffraction in transmission (THEED) and reflection (RHEED) geometries is treated using a general matrix theory, where computer programs and worked examples are provided to illustrate the concepts and to familiarize the reader with practical applications. Diffuse and inelastic scattering and coherence effects are treated comprehensively both as a perturbation of elastic scattering and within the general multiple scattering quantum mechanical framework of the density matrix method. Among the highlights are the treatment of resonance diffraction of electrons, HOLZ diffraction, the formation of Kikuchi bands and lines and ring patterns, and application of diffraction to monitoring of growing surfaces. Useful practical data are summarised in tables including those of electron scattering factors for all the neutral atoms and many ions, and the temperature dependent Debye-Waller factors given for over 100 elemental crystals and compounds.
Although the book is mathematically based, the authors take care to provide a physical interpretation whenever possible, for example by the use of diagrams. The book is hardbound in Oxford blue and looks like the scholarly reference that it is. The serious electron microscopist will find it a sound investment.
Table of Contents:
Basic concepts
Kinematic theory
Dynamical theory I - general theory
Dynamical theory II - THEED
Reflection high energy electron diffraction
Resonance effects in diffraction
Diffuse and inelastic scattering - elementary processes
Diffuse and inelastric scattering - multiple scattering effects
Crystal and diffraction symmetry
Perturbation methods and tensor theory
Digital electron microscopy
Image formation and the retrieval of the wave function
The atomic scattering factor and the optical potential
Debye-Waller factors
Some useful mathematical relations
Green's functions
FORTRAN listing of RHEED routines
Parameterization of the atomic scattering factor
