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  • Crystallographic Instrumentation
      • GET 10% OFF

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      • Publisher's listprice GBP 252.50
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        120 631 Ft (114 887 Ft + 5% VAT)
      • Discount 10% (cc. 12 063 Ft off)
      • Discounted price 108 568 Ft (103 398 Ft + 5% VAT)

    120 631 Ft

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    printed on demand

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    Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.

    Product details:

    • Publisher OUP Oxford
    • Date of Publication 30 April 1998
    • Number of Volumes laminated boards

    • ISBN 9780198559276
    • Binding Hardback
    • No. of pages328 pages
    • Size 242x161x22 mm
    • Weight 641 g
    • Language English
    • Illustrations 102 line figures
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    Short description:

    X-ray crystallography supplies chemists, mineralogists, material scientists, molecular biologists with precise and direct information on crystal and molecular structures of substances and intermolecular interactions. This text provides an up-to-date overview of crystallographic instrumentation and methods of diffraction measurements used for crystal and molecular structure determination. The book provides a unique description of both principles and specific instruments, and methods for data collection, adjustment of instruments, and primary data processing and error correction.

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    Long description:

    This text provides an up-to-date overview of crystallographic instrumentation and methods of diffraction measurements used for crystal and molecular structure determination. The book provides a unique description of both principles and specific instruments, and methods for data collection, adjustment of instruments, and primary data processing and error correction.

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    Table of Contents:

    Radiation used in Crystallography
    Principle of the Diffraction Experiment
    Fundamental Techniques for X-ray Diffractometry
    Single-crystal X-ray Diffractometry
    Single Crystal Diffraction Data Collection and primary Procesing
    Primary Data Reduction and Error Correction in Single-Crystal Diffractometry
    Defects in Crystals and their Influence on X-ray Structure Analysis
    Auxiliary Methods
    References
    Subject Index

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