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  • Characterisation of Radiation Damage by Transmission Electron Microscopy

    Characterisation of Radiation Damage by Transmission Electron Microscopy by Jenkins, M.L; Kirk, M.A;

    Series: Series in Microscopy in Materials Science; 0;

      • GET 20% OFF

      • The discount is only available for 'Alert of Favourite Topics' newsletter recipients.
      • Publisher's listprice GBP 240.00
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        121 464 Ft (115 680 Ft + 5% VAT)
      • Discount 20% (cc. 24 293 Ft off)
      • Discounted price 97 171 Ft (92 544 Ft + 5% VAT)

    121 464 Ft

    db

    Availability

    Estimated delivery time: In stock at the publisher, but not at Prospero's office. Delivery time approx. 3-5 weeks.
    Not in stock at Prospero.

    Why don't you give exact delivery time?

    Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.

    Short description:

    This book details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. It focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms.

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    Long description:

    Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials.

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    Table of Contents:

    The role of transmission electron microscopy in characterising radiation damage. An introduction to the available contrast mechanisms and experimental techniques. Analysis of small centres of strain: the determination of loop morphologies. Analysis of small centres of strain: determination of the vacancy or interstitial natural of small clusters. Analysis of small centres of strain: counting and sizing small clusters. Characterisation of voids and bubbles. Techniques for imaging displacement cascades. High-resolution imaging of radiation damage. In-situ irradiation experiments. Applications of analytical techniques. Radiation damage in amorphous glass. Appendix: The Thompson tetrahdron. References. Index.

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