Atom Probe Field Ion Microscopy
Series: Monographs on the Physics and Chemistry of Materials; 52;
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Product details:
- Publisher OUP Oxford
- Date of Publication 19 September 1996
- ISBN 9780198513872
- Binding Hardback
- No. of pages520 pages
- Size 242x164x33 mm
- Weight 1042 g
- Language English
- Illustrations 4 colour plates, numerous halftones, line figures and maps 0
Categories
Short description:
A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.
MoreLong description:
This book provides a definitive account of the theory, practice and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. Recent advances in the method,which are largely due to the present authors, now permit the atomic-scale chemistry of a solid specimen to be recognised in three dimensions. As a result of these developments, new and exciting applications are rapidly emerging in the field of material science, surface science, and catalysis. The book is a state-of-the art account of this important field, and is intended for a graduate-level readership.
The book is an excellent resource for anyone entering the field ... strongly recommended at all levels among those who feel curious about this non-obvious way of doing high resolution ion microscopy and analysis at the atomic level.
Table of Contents:
Historical background and general introduction
Physical principles of field ion microscopy
FIM image interpretation and application
Physical principles of atom probe interpretation
Statistical analysis of atom probe data
Metallurgical applications
Atom probe studies of non-metallic materials, thin films and surface phenomena
Epilogue: future directions
