Advances in Imaging and Electron Physics
Theory of Intense Beams of Charged Particles
Series: Advances in Imaging and Electron Physics; 166;
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82 950 Ft (79 000 Ft + 5% VAT)
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82 950 Ft
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Product details:
- Publisher Elsevier Science
- Date of Publication 28 July 2011
- ISBN 9780123813107
- Binding Hardback
- No. of pages752 pages
- Size 228x152 mm
- Weight 1110 g
- Language English 0
Categories
Long description:
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
MoreTable of Contents:
- Beam equations
- Exact solutions to the beam equations
- Anti-paraxial expansions
- Solution of the beam formation problem in 3D case
- Asymptotic theory of 3D flows
- Geometrized theory
- Examples of applications
