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  • Advances in Imaging and Electron Physics

    Advances in Imaging and Electron Physics

    Series: Advances in Imaging and Electron Physics; 107;

      • GET 10% OFF

      • The discount is only available for 'Alert of Favourite Topics' newsletter recipients.
      • Publisher's listprice EUR 185.00
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        76 728 Ft (73 075 Ft + 5% VAT)
      • Discount 10% (cc. 7 673 Ft off)
      • Discounted price 69 056 Ft (65 768 Ft + 5% VAT)

    76 728 Ft

    Availability

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    Why don't you give exact delivery time?

    Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.

    Product details:

    • Publisher Elsevier Science
    • Date of Publication 13 April 1999

    • ISBN 9780120147496
    • Binding Hardback
    • No. of pages416 pages
    • Size 229x152 mm
    • Weight 810 g
    • Language English
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    Long description:

    Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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    Table of Contents:

    J. P. Bird, R. Akis, D. Ferry, and M. Stopa, Magneto-Transport as a Probe of Electron Dynamics in Open Quantum Dots. Mohammad F. Alam and Mohammad A. Karim, External Optical Feedback Effects in DFB Semiconductor Lasers. A. Rosenauer and B. Gerthsen, Atomic Scale Strain and Composition Evaluation from High-Resolution Transmission Electron Microscopy Images. R. C. Staunton, Hexagonal Sampling in Imaging Processing. Jeffrey Wood, The Group Representation Network: A General Approach to Invariant Pattern Classification.

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