Advances in Imaging and Electron Physics Including Proceedings CPO-10
Series: Advances in Imaging and Electron Physics; 212;
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Product details:
- Publisher Elsevier Science
- Date of Publication 15 October 2019
- ISBN 9780128174753
- Binding Hardback
- No. of pages376 pages
- Size 229x152 mm
- Weight 700 g
- Language English 0
Categories
Long description:
Advances in Imaging and Electron Physics, Volume 212, merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.
MoreTable of Contents:
Part I. Papers from the Tenth International Conference on Charged Particle Optics
1. Planar multi-reflecting time-of-flight mass-spectrometer of a simple design
Seitkerim B. Bimurzaev
2. Generalization of paraxial trajectory method for the analysis of non-paraxial rays
Shin Fujita
3. Test and characterization of a new post-column imaging energy filter
Frank Kahl, Volker Gerheim, Martin Linck, Heiko Mï¿1⁄2ller, Richard Schillinger, Stephan Uhlemann
4. Electron optics for a multi-pass transmission electron microscope
Marian Mankos, Stewart A. Koppell, Brannon B. Klopfer, Thomas Juffmann, Vladimir Kolarik, Khashayar Shadman, Mark Kasevich
5. A simulation program for electron mirrors using Boundary Element Method
Eric Munro, Haoning Liu, Catherine Rouse, John Rouse
6. An algorithm for simulating the geometric optics of charged particle instruments
Khashayar Shadman
Part II. The Nano-aperture Ion Source
7. Introduction to focused ion beams, ion sources, and the nano-aperture ion source
Leon van Kouwen
8. Nano-fluidic flow in the nano-aperture ion source
Leon van Kouwen
9. Optics of ion emission from the nano-aperture ion source
Leon van Kouwen
10. A model for ion-neutral scattering in the nano-aperture source
Leon van Kouwen
11. Ion emission simulations of the nano-aperture ion source
Leon van Kouwen
12. Processes in the ionization volume of the nano-aperture ion source
Leon van Kouwen
