Introduction to Conventional Transmission Electron Microscopy
Series: Cambridge Solid State Science S.;
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54 152 Ft (51 574 Ft + 5% VAT)
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54 152 Ft
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Estimated delivery time: In stock at the publisher, but not at Prospero's office. Delivery time approx. 3-5 weeks.
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Product details:
- Publisher Cambridge University Press
- Date of Publication 27 March 2003
- ISBN 9780521629959
- Binding Paperback
- No. of pages742 pages
- Size 244x170x38 mm
- Weight 1160 g
- Language English
- Illustrations 322 b/w illus. 25 tables 110 exercises 0
Categories
Short description:
A graduate level textbook covering the fundamentals of conventional transmission electron microscopy, first published in 2003.
MoreLong description:
This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.
'... ideal for students as well as for researchers new to the field.' Materials World
Table of Contents:
1. Basic crystallography; 2. Basic quantum mechanics; 3. The transmission electron microscope; 4. Getting started; 5. Dynamical electron scattering in perfect crystals; 6. Two-beam theory in defect-free crystals; 7. Systematic row and zone axis orientations; 8. Defects in crystals; 9. Electron diffraction patterns; 10. Phase contrast microscopy; Appendices.
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