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    Indexing of Crystal Diffraction Patterns: From Crystallography Basics to Methods of Automatic Indexing

    Indexing of Crystal Diffraction Patterns by Morawiec, Adam;

    From Crystallography Basics to Methods of Automatic Indexing

    Series: Springer Series in Materials Science; 326;

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      • Publisher's listprice EUR 171.19
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        72 618 Ft (69 160 Ft + 5% VAT)
      • Discount 20% (cc. 14 524 Ft off)
      • Discounted price 58 094 Ft (55 328 Ft + 5% VAT)

    72 618 Ft

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    Estimated delivery time: In stock at the publisher, but not at Prospero's office. Delivery time approx. 3-5 weeks.
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    Product details:

    • Edition number 1st ed. 2022
    • Publisher Springer
    • Date of Publication 2 October 2023
    • Number of Volumes 1 pieces, Book

    • ISBN 9783031110795
    • Binding Paperback
    • No. of pages418 pages
    • Size 235x155 mm
    • Weight 789 g
    • Language English
    • Illustrations 148 Illustrations, black & white
    • 542

    Categories

    Short description:

    This book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination.

    The book is intended equally for materials scientists curious about ?nuts and bolts? of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.

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    Long description:

    This book provides a detailed, self-contained description of automatic indexing of crystal diffraction patterns, considering both ab initio indexing and indexing of patterns originating from known structures. Introductory chapters equip the reader with the necessary basic knowledge of geometric crystallography, as well as kinematic and dynamic theories of crystal diffraction. Subsequent chapters delve and describe ab initio indexing of single crystal diffraction patterns and indexing of patterns for orientation determination. The book also reviews methods of indexing powder diffraction and electron spot-type patterns, as well the subject of multigrain indexing. Later chapters are devoted to diffraction by helical structures and quasicrystals, as well as some aspects of lattice parameter refinement and strain determination.

    The book is intended equally for materials scientists curious about ?nuts and bolts? of diffraction pattern indexing and orientation mapping systems, as well as interdisciplinary researchers from physics, chemistry, and biology involved in crystallographic computing. It provides a rigorous, yet accessible, treatment of the subject matter for graduate students interested in understanding the functioning of diffraction pattern indexing engines.

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    Table of Contents:

    Geometric crystallography.- Basic aspects of crystal diffraction.- Diffraction of high energy electrons.- Cartesian reference frames in diffractometry.- Indexing of single crystal diffraction patterns.- Ab-inito indexing of Laue patterns.- Indexing of powder diffraction patterns.- Indexing for orientation determination.- Indexing of spot-type diffraction patterns.- Complications in indexing.- Multigrain indexing.- Beyond diffraction by periodic crystals.- Quasicrystals.- Strain determination

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