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  • Handbook of Infrared Spectroscopy of Ultrathin Films

    Handbook of Infrared Spectroscopy of Ultrathin Films by Tolstoy, VP;

      • GET 10% OFF

      • The discount is only available for 'Alert of Favourite Topics' newsletter recipients.
      • Publisher's listprice GBP 401.95
      • The price is estimated because at the time of ordering we do not know what conversion rates will apply to HUF / product currency when the book arrives. In case HUF is weaker, the price increases slightly, in case HUF is stronger, the price goes lower slightly.

        203 426 Ft (193 739 Ft + 5% VAT)
      • Discount 10% (cc. 20 343 Ft off)
      • Discounted price 183 083 Ft (174 365 Ft + 5% VAT)

    203 426 Ft

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    Availability

    Estimated delivery time: In stock at the publisher, but not at Prospero's office. Delivery time approx. 3-5 weeks.
    Not in stock at Prospero.

    Why don't you give exact delivery time?

    Delivery time is estimated on our previous experiences. We give estimations only, because we order from outside Hungary, and the delivery time mainly depends on how quickly the publisher supplies the book. Faster or slower deliveries both happen, but we do our best to supply as quickly as possible.

    Product details:

    • Publisher Wiley?Blackwell
    • Date of Publication 4 July 2003

    • ISBN 9780471354048
    • Binding Hardback
    • No. of pages736 pages
    • Size 234x166x44 mm
    • Weight 1188 g
    • Language English
    • 0

    Categories

    Short description:

    Research of ultrathin films has attracted tremendous interest in recent years, owing to new applications in microelectronics, sensors, catalysis, and nanotechnology. This handbook serves as an authoritative reference on the growing use of infrared (IR) spectrometry to characterize very thin films at extended interfaces.

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    Long description:

    Research of ultrathin films has attracted tremendous interest in recent years, owing to new applications in microelectronics, sensors, catalysis, and nanotechnology. This handbook serves as an authoritative reference on the growing use of infrared (IR) spectrometry to characterize very thin films at extended interfaces.

    More